Which of the following statements about testing and hot spot formation are TRUE? (You may choose more than one option)

Question

A) In case of partial shading of a module, it is important to verify the absence of hot spots on the non-shaded cells.
B) A current mismatch can lead to irreversible damage on the worst performing cell, such as burning of the encapsulation layer.
C) The risk of hot spot formation due to current mismatch can be eliminated with the implementation of bypass diodes.
D) Hot spots can be a consequence of partial shading, interconnection failures or manufacturing defects of single cells.