The silicon wafer is coated with a layer of metallic aluminum which acts as an electrical contact. The x-ray diffraction pattern of aluminum is measured in a diffractometer with Fe Kα radiation. At what angle, θ, do you expect to observe the first reflection of aluminum, i.e., the reflection at the lowest angle? Express your answer in degrees.

Question

Please help!!

Answer 1

13.2

Answer 2

I got 24.5

Answer 3

They are BOTH wrong.

Answer 4

wrong

Answer 5

i found 8.87

Answer 6

8.87 is right. THANKS!