Asked by Anonychem

The silicon wafer is coated with a layer of metallic aluminum which acts as an electrical contact. The x-ray diffraction pattern of aluminum is measured in a diffractometer with Fe Kα radiation. At what angle, θ, do you expect to observe the first reflection of aluminum, i.e., the reflection at the lowest angle? Express your answer in degrees.

Please help!!

Answers

Answered by Anonymous
13.2
Answered by kaken
I got 24.5
Answered by Anon
They are BOTH wrong.
Answered by Anonymous
wrong
Answered by Anonymous
i found 8.87
Answered by Anonymous
8.87 is right. THANKS!
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