Asked by schoolgirl

The silicon wafer is coated with a layer of metallic aluminum which acts as an electrical contact. The x-ray diffraction pattern of aluminum is measured in a diffractometer with Fe Kα radiation. At what angle, θ, do you expect to observe the first reflection of aluminum, i.e., the reflection at the lowest angle? Express your answer in degrees.
Answered by DrBob222
Use lamba = 2d*sin(theta)
d is the distance between planes in Al and I don't know d. You can look up K alpha for Fe and d for Al.
Answered by Anonymous
13.8
Answered by schoolgirl
Many thanks. I see now :)
Answered by Wo Ming
It's wrong.
What's the answer?
There are no AI answers yet. The ability to request AI answers is coming soon!